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BUTTONMEMORY®
SURVIVES RUGGED
MIL-STD 810F ENVIRONMENTAL TESTS
MacSema Inc. announces that
ButtonMemory, Contact Memory Buttons (CMB’s) have successfully completed
rigorous MIL-STD 810F environmental tests conducted by an independent third
party. MIL-STD 810F is a US Department of Defense standard for testing the
impact of environmental stress on material throughout all phases of its service
life.
Fourteen environmental tests were
selected from MIL-STD-810F and were carried out on ButtonMemory technology.
Three additional tests were also conducted: (Shear/Impact, Magnetic Field and
the Gamma radiation). The MIL-STD 810F test parameters included:
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500 Low Pressure (Altitude)
501 High Temperature
502 Low Temperature
503 Temperature Shock
504 Contamination by Fluids
506 Rain
507 Humidity
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509 Salt Fog
510 Sand and Dust
512 Immersion
513 Acceleration
516 Shock
518 Acidic Atmosphere
521 Icing/Freezing Rain
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Additional Tests:
* Shear/Impact
* Magnetic Field
* Gamma Radiation
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A ButtonMemory is a rugged,
battery free, read/write identification device designed to support
universal automatic identification applications on components and
equipment. When attached to equipment and related components a memory
button functions as an electronic log book (portable data base) to
advance configuration management, maintenance record keeping, asset
tracking, and other logistical support functions through out the item’s
life cycle. |
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